Shear Forces and Heat Conductance in Nanoscale Junctions
B. J. Robinson, M. E. Pumarol, and O. V. Kolosov

TL;DR
This study investigates the relationship between shear forces and heat conductance at nanoscale contacts, revealing a fundamental link that enhances understanding of thermal transport in nanoelectronic interfaces.
Contribution
It introduces a novel correlation between shear force and thermal conductance in nanoscale contacts, supported by experimental validation and theoretical analysis.
Findings
Confirmed ballistic nature of heat transport in nanoscale contacts
Discovered a fundamental relation linking shear strength and thermal conductance
Proposed a nanoscale analogue of the Wiedemann-Franz law
Abstract
Nanoscale solid-solid contacts define a wealth of material behaviours from the electrical and thermal conductivity in modern electronic devices to friction and losses in micro- and nanoelectromechanical systems. For modern ultra-high integration processor chips, power electronic devices and thermoelectrics one of the most essential, but thus far most challenging, aspects is the assessment of the heat transport at the nanoscale sized interfaces between their components. While this can be effectively addressed by a scanning thermal microscopy, or SThM, which demonstrates the highest spatial resolution to thermal transport to date, SThM quantitative capability is undermined by the poorly defined nature of the nanoscale contact between the probe tip and the sample. Here we show that simultaneous measurements of the shear force and the heat flow in the probe-sample junction shows distinct…
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