Inter-laboratory comparison of a WDS-EDS quantitative X-ray microanalysis of a metallic glass
Philippe Jonnard (LCPMR), Fran\c{c}ois Brisset (LPCES, ICMMO),, Florence Robaut (CMTC), Guillaume Wille (BRGM), Jacky Ruste (LCPMR)

TL;DR
This study compares WDS and EDS microanalysis techniques across multiple laboratories for a nickel-based metallic glass, highlighting the influence of experimental parameters and the inherent advantages of WDS for accurate quantification.
Contribution
It provides a comprehensive inter-laboratory comparison of WDS and EDS methods for metallic glass analysis, identifying factors affecting result dispersion and suggesting WDS's potential superiority.
Findings
Results from WDS and EDS are close to reference values.
Dispersion is larger at 5 kV due to L line use and lower intensities.
WDS generally shows less dispersion than EDS.
Abstract
We conducted an inter-laboratory study of a metallic glass whose main component is nickel. Two determinations of the mass fractions of the different elements present within the sample were asked to the participants: one at an acceleration voltage of 15 or 20 kV and another one at 5 kV. We compare the mass fractions obtained from wavelength dispersive (WDS) and energy dispersive spectrometries (EDS) and also try to find an influence of the kind of EDS detector and its entrance window, the background subtraction method, the use or not of standards as well as the quantification method. Both means of WDS and EDS mass fractions are close to the reference values. The dispersion of the results was larger at 5 kV than at 15-20 kV owing to the use of the L lines rather than K lines and to the lowest collected intensities. There is an exception with the case of boron because at the lowest…
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