Novel opportunities for sub-meV inelastic X-ray scattering at high-repetition rate self-seeded X-ray free-electron lasers
Oleg Chubar, Gianluca Geloni, Vitali Kocharyan, Anders Madsen, Evgeni, Saldin, Svitozar Serkez, Yuri Shvyd'ko, John Sutter

TL;DR
This paper proposes enhancements to inelastic X-ray scattering techniques using high-repetition rate free-electron lasers, aiming for sub-meV energy resolution and significantly increased flux for advanced condensed matter studies.
Contribution
It introduces optimized X-ray optics and increased spectral flux strategies to achieve sub-meV resolution in IXS at high-repetition rate XFELs, expanding capabilities for condensed matter research.
Findings
Achieves potential for 0.1 meV energy resolution in IXS.
Proposes a method to increase spectral flux by up to three orders of magnitude.
Demonstrates feasibility of high-flux, ultra-high-resolution IXS at XFEL facilities.
Abstract
Inelastic X-ray scattering (IXS) is an important tool for studies of equilibrium dynamics in condensed matter. A new spectrometer recently proposed for ultra-high-resolution IXS (UHRIX) has achieved 0.6~meV and 0.25~nm spectral and momentum transfer resolutions, respectively. However, further improvements down to 0.1~meV and 0.02~nm are required to close the gap in energy-momentum space between high and low frequency probes. We show that this goal can be achieved by further optimizing the X-ray optics and by increasing the spectral flux of the incident X-ray pulses. UHRIX performs best at energies from 5 to 10 keV, where a combination of self-seeding and undulator tapering at the SASE-2 beamline of the European XFEL promises up to a hundred-fold increase in average spectral flux compared with nominal SASE pulses at saturation, or three orders of magnitude more than…
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