Application of SOI Area Detectors to Synchrotron Radiation X-ray Experiments
Ryo Hashimoto, Noriyuki Igarashi, Reiji Kumai, Shunji Kishimoto
TL;DR
This paper discusses the development and application of Silicon-On-Insulator (SOI) area detectors, specifically SOPHIAS, for synchrotron radiation X-ray experiments, including diffraction and scattering studies.
Contribution
It introduces the current status of developing SOI-based pulse-counting X-ray detectors and their application in synchrotron experiments at the Photon Factory.
Findings
Development of SOI area detectors for X-ray experiments
Application of SOPHIAS detector in diffraction studies
Progress in pulse-counting X-ray detector technology
Abstract
Application of new detectors using Silicon-On-Insulator (SOI) technology has been started in the Photon Factory, KEK. This project has two purposes. The first purpose is to develop a pulse-counting-type X-ray detector which can be used in synchrotron soft X-ray experiments. The second one is to apply the SOI area detector developed by RIKEN, SOPHIAS, to X-ray diffraction and small-angle scattering experiments in Photon Factory. In this paper, we introduce the current status of our project.
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Taxonomy
TopicsParticle Detector Development and Performance · Nuclear Physics and Applications · Medical Imaging Techniques and Applications