Modally Resolved Fabry-Perot Experiment with Semiconductor Waveguides

TL;DR

This paper demonstrates a modal-resolved Fabry-Perot technique combined with Fourier analysis to characterize and distinguish the properties of different spatial modes in semiconductor waveguides, aiding optimization for nonlinear optical applications.

Contribution

It introduces a method for detailed modal analysis of multimode semiconductor waveguides using Fabry-Perot fringes and Fourier analysis, enabling mode-specific property characterization.

Findings

Separation of mode-specific loss and dispersion characteristics

Enhanced understanding of spatial mode properties in semiconductor waveguides

Potential for improved waveguide design through modal analysis

Abstract

Based on the interaction between different spatial modes, semiconductor Bragg-reflection waveguides provide a highly functional platform for non-linear optics. Therefore, the control and engineering of the properties of each spatial mode is essential. Despite the multimodeness of our waveguide, the well-established Fabry-Perot technique for recording fringes in the optical transmission spectrum can successfully be employed for a detailed linear optical characterization when combined with Fourier analysis. A prerequisite for the modal sensitivity is a finely resolved transmission spectrum that is recorded over a broad frequency band. Our results highlight how the features of different spatial modes, such as their loss characteristics and dispersion properties, can be separated from each other allowing their comparison. The mode-resolved measurements are important for optimizing the performance of such multimode waveguides by tailoring the properties of their spatial modes.