Electroluminescence from nitrogen-vacancy and interstitial-related centers in bulk diamond stimulated by ion-beam-fabricated sub-superficial graphitic micro-electrodes
J. Forneris, S. Ditalia Tchernij, A. Battiato, F. Picollo, A., Tengattini, V. Grilj, N. Skukan, G. Amato, L. Boarino, I. P. Degiovanni, E., Enrico, P.Traina, M. Jak\v{s}i\'c, M. Genovese, P. Olivero

TL;DR
This paper demonstrates a diamond device with embedded graphitic micro-electrodes that electrically stimulates electroluminescence from nitrogen-vacancy centers and interstitial defects, revealing new emission lines and potential for quantum applications.
Contribution
It introduces a novel method to electrically excite defect centers in diamond using ion-beam-fabricated micro-electrodes, with detailed characterization of electroluminescence and defect-related emissions.
Findings
Electroluminescence from NV0 centers was successfully stimulated.
New sharp emission lines at 563 nm and 580 nm were observed.
Device operation required a bias voltage above approximately 300V.
Abstract
We report on the fabrication and characterization of a single-crystal diamond device for the electrical stimula- tion of light emission from nitrogen-vacancy (NV0) and other defect-related centers. Pairs of sub-superficial graphitic micro-electrodes embedded in insulating diamond were fabricated by a 6 MeV C3+ micro-beam irra- diation followed by thermal annealing. A photoluminescence (PL) characterization evidenced a low radiation damage concentration in the inter-electrode gap region, which did not significantly affect the PL features domi- nated by NV centers. The operation of the device in electroluminescence (EL) regime was investigated by ap- plying a bias voltage at the graphitic electrodes, resulting in the injection of a high excitation current above a threshold voltage (~300V), which effectively stimulated an intense EL emission from NV0 centers. In addition, we report on the…
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Taxonomy
TopicsDiamond and Carbon-based Materials Research · Semiconductor materials and devices · Ion-surface interactions and analysis
