Exploring properties of the integrating pixels

TL;DR

This paper investigates the characteristics of integrating pixels in SOI sensors, focusing on noise filtering, sampling effects, and leakage current measurements to understand their performance and properties.

Contribution

It provides new insights into the filtering properties and leakage currents of integration-type pixels in SOI sensors, based on experimental tests and analysis.

Findings

Correlated Double Sampling effectively reduces noise in integration pixels.

Leakage current measurements vary between different pixel detector chips.

Sampling intervals significantly impact noise filtering performance.

Abstract

This paper presents some observations and ideas collected during the tests of the SOI sensors, based on the integration type pixels. First, it contains a rough analysis of the Correlated Double Sampling filtering properties with respect to different noise sources and long sampling intervals, which are typical for the pixels under consideration. Second, results of the pixel leakage current measurements in the pix_2012 and DIPIX pixel detector chips are presented.