Experimental Demonstration of Effective Medium Approximation Breakdown in Deeply Subwavelength All-Dielectric Multilayers

TL;DR

This paper experimentally shows the breakdown of the effective medium approximation in deeply subwavelength all-dielectric multilayers, revealing significant differences in optical properties that challenge existing theoretical models and impact sensing technologies.

Contribution

It provides the first experimental validation of the effective medium approximation breakdown in deeply subwavelength dielectric multilayers, highlighting the importance of layer thickness and ordering.

Findings

Reflectance spectra differ significantly for 10-nm vs. 20-nm layers.

Layer ordering affects optical response contrary to predictions.

Resonator layer enhances the breakdown effect.

Abstract

We experimentally demonstrate the effect of anomalous breakdown of the effective medium approximation in all-dielectric deeply subwavelength thickness ($d \sim\lambda/160-\lambda/30$) multilayers, as recently predicted theoretically [H.H. Sheinfux et al., Phys. Rev. Lett. 113, 243901 (2014)]. Multilayer stacks are composed of alternating alumina and titania layers fabricated using atomic layer deposition. For light incident on such multilayers at angles near the total internal reflection we observe pronounced differences in the reflectance spectra for structures with 10-nm versus 20-nm thick layers, as well as for structures with different layers ordering, contrary to the predictions of the effective medium approximation. The reflectance difference can reach values up to 0.5, owing to the chosen geometrical configuration with an additional resonator layer employed for the enhancement of the effect. Our results are important for the development of new high-precision multilayer ellipsometry methods and schemes, as well as in a broad range of sensing applications.