Wakefield-Induced Ionization injection in beam-driven plasma accelerators
A. Martinez de la Ossa, T. J. Mehrling, L. Schaper, M. J. V. Streeter,, J. Osterhoff

TL;DR
This paper analyzes Wakefield-Induced Ionization (WII) injection in beam-driven plasma accelerators, highlighting its ability to produce high-quality electron bunches with controlled charge and energy spread, enabling advanced staged acceleration.
Contribution
It provides a detailed analysis of WII injection in the blowout regime, demonstrating its potential for controlled, high-brightness electron beam generation and self-similar staging in plasma accelerators.
Findings
WII injection produces short, low-emittance electron bunches.
Adjustable charge via dopant gas concentration.
Potential for high-brightness, staged acceleration.
Abstract
We present a detailed analysis of the features and capabilities of Wakefield-Induced Ionization (WII) injection in the blowout regime of beam driven plasma accelerators. This mechanism exploits the electric wakefields to ionize electrons from a dopant gas and trap them in a well-defined region of the accelerating and focusing wake phase, leading to the formation of high-quality witness-bunches [Martinez de la Ossa et al., Phys. Rev. Lett. 111, 245003 (2013)]. The electron-beam drivers must feature high-peak currents () and a duration comparable to the plasma wavelength to excite plasma waves in the blowout regime and enable WII injection. In this regime, the disparity of the magnitude of the electric field in the driver region and the electric field in the rear of the ion cavity allows for the selective ionization and subsequent trapping from a narrow phase…
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