Low-error and broadband microwave frequency measurement in a silicon chip

TL;DR

This paper demonstrates a low-error, broadband microwave frequency measurement system on a silicon chip using nonlinear optical interactions, specifically four-wave mixing, achieving a 40 GHz bandwidth with minimal error.

Contribution

It introduces the first on-chip four-wave mixing based instantaneous frequency measurement system utilizing silicon waveguides, enabling broadband and low-error microwave frequency detection.

Findings

Achieved 40 GHz measurement bandwidth.

Demonstrated low measurement error.

Showcased potential for fully integrated silicon chip IFM system.

Abstract

Instantaneous frequency measurement (IFM) of microwave signals is a fundamental functionality for applications ranging from electronic warfare to biomedical technology. Photonic techniques, and nonlinear optical interactions in particular, have the potential to broaden the frequency measurement range beyond the limits of electronic IFM systems. The key lies in efficiently harnessing optical mixing in an integrated nonlinear platform, with low losses. In this work, we exploit the low loss of a 35 cm long, thick silicon waveguide, to efficiently harness Kerr nonlinearity, and demonstrate the first on-chip four-wave mixing (FWM) based IFM system. We achieve a large 40 GHz measurement bandwidth and record-low measurement error. Finally, we discuss the future prospect of integrating the whole IFM system on a silicon chip to enable the first reconfigurable, broadband IFM receiver with low-latency.