Measurement of radioactive contamination in the high-resistivity silicon CCDs of the DAMIC experiment
A. Aguilar-Arevalo, D. Amidei, X. Bertou, D. Bole, M. Butner, G., Cancelo, A. Casta\~neda V\'azquez, A.E. Chavarria, J.R.T. de Mello Neto, S., Dixon, J.C. D'Olivo, J. Estrada, G. Fernandez Moroni, K.P. Hern\'andez, Torres, F. Izraelevitch, A. Kavner, B. Kilminster, I. Lawson

TL;DR
This paper measures radioactive contamination in silicon CCDs used by DAMIC for dark matter detection, developing novel spatial analysis methods to quantify uranium, thorium, and other isotopes, demonstrating contamination levels low enough for future experiments.
Contribution
It introduces new analysis techniques exploiting CCD spatial resolution to identify and quantify radioactive isotopes in detector materials, improving contamination assessment for dark matter searches.
Findings
Uranium and thorium contamination limits established
Decay rates of $^{32}$Si and $^{210}$Pb measured or constrained
Contamination levels deemed acceptable for future DAMIC detector operation
Abstract
We present measurements of radioactive contamination in the high-resistivity silicon charge-coupled devices (CCDs) used by the DAMIC experiment to search for dark matter particles. Novel analysis methods, which exploit the unique spatial resolution of CCDs, were developed to identify and particles. Uranium and thorium contamination in the CCD bulk was measured through spectroscopy, with an upper limit on the U (Th) decay rate of 5 (15) kg d at 95% CL. We also searched for pairs of spatially correlated electron tracks separated in time by up to tens of days, as expected from Si-P or Pb-Bi sequences of decays. The decay rate of Si was found to be kg d (95% CI). An upper limit of 35 kg d (95% CL) on the Pb decay rate was obtained…
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