Versatile AFM setup combined with micro-focused X-ray beam

TL;DR

This paper presents the integration of a portable atomic force microscope with a micro-focused X-ray beamline, enabling precise nanoscale studies and manipulation of nanostructures under synchrotron illumination.

Contribution

It introduces a novel combined AFM and synchrotron setup, detailing design, alignment, and performance for nanoscale X-ray experiments.

Findings

Successful integration of AFM with synchrotron beamline

Precise nanomanipulation under X-ray illumination

Enhanced capabilities for nanoscale strain and process studies

Abstract

Micro-focused X-ray beams produced by third generation synchrotron sources offer new perspective of studying strains and processes at nanoscale. Atomic force microscope setup combined with a micro-focused synchrotron beam allows precise positioning and nanomanipulation of nanostructures under illumination. In this paper, we report on integration of a portable commercial atomic force microscope setup into a hard X-ray synchrotron beamline. Details of design, sample alignment procedure and performance of the setup are presented.