Main Magnetic Focus Ion Source: II. The first investigations at 10 keV

TL;DR

This paper introduces a new compact ion source design utilizing a magnetic lens to create a local ion trap, demonstrating successful production of highly charged ions and controllable trap depth.

Contribution

It presents the design principles of the main magnetic focus ion source and provides experimental evidence of producing highly charged ions with controllable trapping.

Findings

Successful production of Ir$^{59+}$, Xe$^{44+}$, and Ar$^{16+}$ ions.

Demonstrated control over the depth of the local ion trap.

Validated the design principles of the new ion source.

Abstract

The basic principles of design for the compact ion source of new generation are presented. The device uses the local ion trap created by the axial electron beam rippled in a thick magnetic lens. In accordance with this feature, the ion source is given the name main magnetic focus ion source. The experimental evidences for the production of Ir$^{59+}$, Xe$^{44+}$, and Ar$^{16+}$ ions are obtained. The control over depth of the local ion trap is shown to be feasible.