Poole-Frenkel effect and Variable-Range Hopping conduction in metal / YBCO resistive switching devices

TL;DR

This study investigates the conduction mechanisms in Au/YBCO resistive switching devices, revealing a Poole-Frenkel emission process linked to oxygen vacancies and variable-range hopping, influenced by electrical pulses and temperature.

Contribution

It demonstrates the role of Poole-Frenkel emission and variable-range hopping in resistive switching, highlighting the impact of oxygen depletion and electrical pulse parameters on conduction.

Findings

Poole-Frenkel emission mechanism identified in YBCO interfaces.

Trap energy levels remain constant up to a critical voltage.

Oxygen depletion layer influences conduction behavior.

Abstract

Current-voltage (IV) characteristics and the temperature dependence of the contact resistance [$R(T)$] of Au / YBa$_2$Cu$_3$O$_{7-\delta}$ (optimally doped YBCO) interfaces have been studied at different resistance states. This states were produced by resistive switching after accumulating cyclic electrical pulses of increasing number and voltage amplitude. The IV characteristics and the $R(T)$ dependence of the different states are consistent with a Poole-Frenkel (P-F) emission mechanism with trapping-energy levels $E_t$ in the 0.06-0.11 eV range. $E_t$ remains constant up to a number-of-pulses-dependent critical voltage and increases linearly with further increasing the voltage amplitude of the pulses. The observation of a P-F mechanism reveals the existence of an oxygen-depleted layer of YBCO near the interface. A simple electrical transport scenario is discussed, where the degree of disorder, the trap energy level and the temperature range determine an electrical conduction dominated by non-linear effects, or by a P-F emission or by a Variable-Range Hopping regime.