Extraction of the index of refraction by embedding multiple and close small inclusions

TL;DR

This paper introduces a method to reconstruct the index of refraction by embedding multiple close small inclusions, enabling the extraction of Green function values and overcoming issues caused by zeros in internal fields.

Contribution

It proposes using multiple close inclusions to derive internal Green function values from farfield measurements, improving index of refraction reconstruction.

Findings

Successfully derives Green function values from asymptotic expansions.

Overcomes internal field zeros issue by using multiple inclusions.

Validates method through acoustic scattering experiments.

Abstract

We deal with the problem of reconstructing material coefficients from the farfields they generate. By embedding small (single) inclusions to these media, located at points $z$ in the support of these materials, and measuring the farfields generated by these deformations we can extract the values of the total field generated by these media at the points $z$. The second step is to extract the values of the material coefficients from these internal values of the total field. The main difficulty in using internal fields is the treatment of their possible zeros. In this work, we propose to deform the medium using multiple (precisely double) and close inclusions instead of only single ones. By doing so, we derive from the asymptotic expansions of the farfields the internal values of the Green function, in addition to the internal values of the total fields. This is possible because of the deformation of the medium with multiple and close inclusions which generates scattered fields due to the multiple scattering between these inclusions. Then, the values of the index of refraction can be extracted from the singularities of the Green function. Hence, we overcome the difficulties arising from the zeros of the internal fields. We test these arguments for the acoustic scattering by a refractive index in presence of inclusions modeled by the impedance type small obstacles.