Evidence of rapid tin whisker growth under electron irradiation
A. C. Vasko, G. R. Warrell, E. Parsai, V. G. Karpov, Diana Shvydka

TL;DR
This study demonstrates that electron irradiation can induce tin whisker growth, supporting electrostatic theories and offering a new method to study whisker formation and develop accelerated testing protocols.
Contribution
It provides experimental evidence linking electron irradiation to tin whisker growth, advancing understanding of whisker formation mechanisms.
Findings
Electron radiation induces tin whisker growth.
Control samples without irradiation did not develop whiskers.
Supports electrostatic theory of whisker growth.
Abstract
We have investigated the influence of electric field on tin whisker growth. Sputtered tin samples were exposed to electron radiation, and were subsequently found to have grown whiskers, while sister control samples did not exhibit whisker growth. Statistics on the whisker properties are reported. The results are considered encouraging for substantiating an electrostatic theory of whisker growth, and the technique offers promise for investigating early stages of whisker growth in general and establishing whisker-related accelerated life testing protocols.
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Taxonomy
TopicsElectronic Packaging and Soldering Technologies · Semiconductor materials and devices · Semiconductor materials and interfaces
