Optical diffraction for measurements of nano-mechanical bending
Rodolfo I. Hermans, Benjamin Dueck, Joseph Wafula Ndieyira and, Rachel A. McKendry, Gabriel Aeppli

TL;DR
This paper investigates optical diffraction effects in nano-mechanical cantilever measurements, revealing how diffraction patterns can be exploited for more accurate, flexible, and high-resolution detection of cantilever bending and molecular activity.
Contribution
It introduces a novel diffraction-based measurement technique that improves calibration, decouples tilt and curvature detection, and offers nanometre resolution, surpassing traditional optical beam deflection methods.
Findings
Diffraction effects significantly impact calibration of cantilever bending measurements.
Exploiting diffraction patterns enables decoupled tilt and curvature measurements.
New detection method achieves sub-2.5 nm resolution, suitable for bio-assays.
Abstract
Micromechanical transducers such as cantilevers for AFM often rely on optical readout methods that require illumination of a specific region of the microstructure. Here we explore and exploit the diffraction effects that have been previously neglected when modeling cantilever bending measurement techniques. The illumination of a cantilever end causes an asymmetric diffraction pattern at the photodetector that significantly affects the calibration of the signal in the popular optical beam deflection technique (OBDT). Conditions for optimized linear signals that avoid detection artifacts conflict with small numerical aperture illumination and narrow cantilevers which are softer and therefore more sensitive. Embracing diffraction patterns as a physical measurable allows a richer detection technique that decouples measurements of tilt and curvature and simultaneously relaxes the…
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