Critical analysis and remedy of switching failures in straintronic logic using Bennett clocking in the presence of thermal fluctuations

TL;DR

This paper critically analyzes switching failures in straintronic logic caused by thermal fluctuations, using stochastic modeling to understand error mechanisms and proposing solutions to improve reliability in thermally noisy environments.

Contribution

It provides a detailed stochastic analysis of thermally induced switching failures in straintronic logic and suggests methods to mitigate these errors.

Findings

Thermal fluctuations cause significant switching errors in straintronic devices.

Magnetization switching delay exhibits broad distribution due to thermal effects.

Proposed remedies can reduce error rates in thermally perturbed conditions.

Abstract

Straintronic logic is a promising platform for beyond Moore's law computing. Using Bennett clocking mechanism, information can propagate through an array of strain-mediated multiferroic nanomagnets exploiting the dipolar coupling between the magnets without having to physically interconnect them. Here we perform a critical analysis of switching failures, i.e., error in information propagation due to thermal fluctuations through a chain of such straintronic devices. We solved stochastic Landau-Lifshitz-Gilbert equation considering room-temperature thermal perturbations and show that magnetization switching may fail due to inherent magnetization dynamics accompanied by thermally broadened switching delay distribution. Avenues available to circumvent such issue are proposed.