Far field imaging of a dielectric inclusion
Abdul Wahab, Naveed Ahmed, Tasawar Abbas
TL;DR
This paper introduces a non-iterative topological sensitivity method for reliably detecting dielectric inclusions in the far field using electric scattering data, analyzing its resolution, stability, and noise robustness.
Contribution
It presents a novel non-iterative framework for far field detection of dielectric inclusions, applicable to single and multiple measurements, with theoretical performance analysis.
Findings
Effective detection of dielectric inclusions demonstrated
Resolution and stability characterized theoretically
Algorithm robust against noise and measurement variations
Abstract
A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.
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