Low-field microwave absorption and magnetoresistance in iron nanostructures grown by electrodeposition on n-type lightly-doped silicon substrates

TL;DR

This paper explores the magnetic properties and spin dynamics of iron nanostructures electrodeposited on silicon, demonstrating potential for contactless spin injection and detection using magnetic resonance techniques.

Contribution

It introduces magnetic resonance as a novel, contactless method to analyze spin injection and magnetoresistance in Fe/Si nanostructures, advancing spintronic research.

Findings

Observation of hysteresis in magnetic resonance spectra

Detection of broad peak indicating low field microwave absorption

Correlation between magnetic resonance and magnetoresistance features

Abstract

In this study we investigate magnetic properties, surface morphology and crystal structure in iron nanoclusters electrodeposited on lightly-doped (100) n-type silicon substrates. Our goal is to investigate the spin injection and detection in the Fe/Si lateral structures. The samples obtained under electric percolation were characterized by magnetoresistive and magnetic resonance measurements with cycling the sweeping applied field in order to understand the spin dynamics in the as-produced samples. The observed hysteresis in the magnetic resonance spectra, plus the presence of a broad peak in the non-saturated regime confirming the low field microwave absorption (LFMA), were correlated to the peaks and slopes found in the magnetoresistance curves. The results suggest long range spin injection and detection in low resistive silicon and the magnetic resonance technique is herein introduced as a promising tool for analysis of electric contactless magnetoresistive samples.