Error Compensation of Single-Qubit Gates in a Surface Electrode Ion Trap Using Composite Pulses

TL;DR

This paper demonstrates high-fidelity single-qubit gates in a surface electrode ion trap by stabilizing optical fields and employing composite pulse sequences, achieving low error rates suitable for quantum computing.

Contribution

It introduces the use of composite pulse sequences and stabilization techniques to improve single-qubit gate fidelity in surface electrode ion traps.

Findings

Achieved an average error per gate of 3.6×10⁻⁴ using randomized benchmarking.

Implemented palindromic pulse sequences that scale efficiently with sequence length.

Demonstrated stabilization of optical fields enhances gate fidelity.

Abstract

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high fidelity single-qubit gates for the hyperfine qubit of a $^{171}\text{Yb}^+$ ion trapped in a microfabricated surface electrode ion trap. Gate error is characterized using a randomized benchmarking protocol, and an average error per randomized Clifford group gate of $3.6(3)\times10^{-4}$ is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.