Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V$_2$O$_3$

TL;DR

This study demonstrates soft-X-ray ARPES on tiny V$_2$O$_3$ surfaces using micro focusing and positioning, enabling detailed band mapping of small, irregularly cleaved samples for three-dimensional electronic structure analysis.

Contribution

Introduction of micro positioning techniques combined with micro focus beam for ARPES on small, irregular surfaces of correlated materials like V$_2$O$_3$.

Findings

Successful observation of band dispersions from tiny surfaces.

Position dependence of spectra reflects surface morphology.

Enabled 3D band mapping on small cleaved samples.

Abstract

We have performed soft-X-ray angle resolved photoemission for metallic V$_2$O$_3$. Combining a micro focus beam (40 x 65 ${\mu}$m$^2$) and micro positioning techniques with a long working distance microscope, we have succeeded in observing band dispersions from tiny cleavage surfaces with typical size of the several tens of ${\mu}$m. The photoemission spectra show a clear position dependence reflecting the morphology of the cleaved sample surface. By selecting high quality flat regions on the sample surface, we have succeeded in band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional ARPES for typical three dimensional correlated materials where large cleavage planes are rarely obtained.