A more accurate measurement of the $^{28}$Si lattice parameter

TL;DR

This paper presents a refined measurement of the $^{28}$Si lattice parameter, reducing uncertainty and confirming previous results, which is crucial for precise fundamental constant determinations.

Contribution

The study provides a more accurate measurement of the $^{28}$Si lattice parameter with reduced uncertainty, aiding in resolving discrepancies in fundamental constant measurements.

Findings

Confirmed previous $^{28}$Si lattice parameter value

Reduced measurement uncertainty

Supports consistency in fundamental constant determinations

Abstract

In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of $^{28}$Si {220} lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value $d_{220}=192014711.98(34)$ am having a reduced uncertainty.