Main Magnetic Focus Ion Source: I. Basic principles and theoretical predictions
V. P. Ovsyannikov, A. V. Nefiodov

TL;DR
This paper introduces a novel magnetic focus ion source that uses rippled electron beams in a focusing magnetic field to produce highly charged ions efficiently in a compact setup, with promising high current densities.
Contribution
It presents the basic principles and theoretical predictions for a new type of ion source utilizing local potential traps formed by rippled electron beams in magnetic fields.
Findings
High electron current densities achievable in short ion traps.
Potential to produce high-intensity highly charged ion beams.
Design feasibility for compact ion sources.
Abstract
It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, the extremely high electron current densities can be attained on short length of the ion trap. The design the very compact ion sources is feasible. For such ions as, for example, Ne and Xe, the intensities of about and particles per second, respectively, can be obtained.
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Taxonomy
TopicsMass Spectrometry Techniques and Applications · Plasma Diagnostics and Applications · Ion-surface interactions and analysis
