Indium Tin Oxide film characterization using the classical Hall effect
Laurens Willems van Beveren, Evgeniy Panchenko, Nik Anachi, Lachlan, Hyde, Dan Smith, Timothy James, Ann Roberts, Jeffrey McCallum

TL;DR
This paper uses the classical Hall effect to electrically characterize Indium Tin Oxide (ITO) films grown by different methods, providing insights into their electrical properties and optical transparency.
Contribution
It introduces a method to characterize ITO films grown by different techniques using the classical Hall effect, linking electrical and optical properties.
Findings
ITO films are electrically conductive and optically transparent in visible spectrum.
Near-infrared transmission of ITO reduces with thickness, affecting optical properties.
Hall effect measurements provide valuable data on electrical characteristics of ITO films.
Abstract
We have used the classical Hall effect to electrically characterize Indium Tin Oxide (ITO) films grown by two different techniques on silica substrates. ITO films have the unique property that they can be both electrically conducting (and to be used for a gate electrode for example) as well as optically transparent (at least in the visible part of the spectrum). In the near infrared (NIR) the transmission typically reduces. However, the light absorption can in principle be compensated by growing thinner films.
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