Hardware Probing Interface and Test Robustness
A. M. Dorman

TL;DR
This paper presents a hardware probing interface and testing method that uses voltage and current measurements to validate product integrity and probe robustness, aiming to improve maintenance and fault detection.
Contribution
It introduces a new integrity testing approach based on voltage/current characteristics and a self-test method for probe validation to enhance hardware testing reliability.
Findings
Effective detection of hardware faults through voltage/current testing
Improved probe validation reduces maintenance failures
Enhanced robustness of hardware testing procedures
Abstract
Computerized integrity test of an electronic product hardware interface and product probing validation are considered. Integrity testing is based on a current voltage characteristic measurement, when a small voltage and/or current stimuli are applied to the product pads including power supply circuitry pads, so that the product is not normally powered on. Test fixture needles validation is a part of a self test maintenance scenario designed to predict deterioration of product probing.
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Taxonomy
TopicsIntegrated Circuits and Semiconductor Failure Analysis · Electrostatic Discharge in Electronics · VLSI and Analog Circuit Testing
