Surface properties of atomically flat poly-crystalline SrTiO3
Sungmin Woo, Hoidong Jeong, Sang A Lee, Hosung Seo, Morgane Lacotte,, Adrian David, Hyun You Kim, Wilfrid Prellier, Yunseok Kim, Woo Seok Choi

TL;DR
This study develops a method to produce atomically flat single- and poly-crystalline SrTiO3 surfaces, enabling precise comparison of their properties and advancing understanding of grain boundary effects in transition metal oxides.
Contribution
The paper introduces a fabrication approach for atomically flat poly-crystalline SrTiO3 substrates, facilitating detailed studies of grain boundary phenomena in TMOs.
Findings
Successfully prepared atomically flat poly-crystalline STO surfaces.
Optimized annealing conditions for different STO surface orientations.
Enables comparative studies of single- and poly-crystalline TMO properties.
Abstract
Comparison between single- and the poly-crystalline structures provides essential information on the role of long-range translational symmetry and grain boundaries. In particular, by comparing single- and poly-crystalline transition metal oxides (TMOs), one can study intriguing physical phenomena such as electronic and ionic conduction at the grain boundaries, phonon propagation, and various domain properties. In order to make an accurate comparison, however, both single- and poly-crystalline samples should have the same quality, e.g., stoichiometry, crystallinity, thickness, etc. Here, by studying the surface properties of atomically flat poly-crystalline SrTiO3 (STO), we propose an approach to simultaneously fabricate both single- and poly-crystalline epitaxial TMO thin films on STO substrates. In order to grow TMOs epitaxially with atomic precision, an atomically flat,…
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