Electric-field induced switching from fcc to hcp stacking of a single layer of Fe/Ni(111)

TL;DR

This paper demonstrates how an electric field can induce a phase transition from fcc to hcp stacking in a single Fe layer on Ni(111), using low-temperature STM to observe atomic-scale changes.

Contribution

It provides the first atomic-resolution evidence of electric-field driven stacking transition in a single Fe monolayer on Ni(111).

Findings

Electric field induces fcc to hcp transition in Fe/Ni(111).

Transition observed at 4 K with atomic resolution.

STM confirms reversible phase change.

Abstract

We present a detailed study of an electric-field induced phase transition of a single layer of Fe on a Ni(111) substrate. Scanning tunneling microscopy at 4 K substrate temperature is used to provide the necessary electric field and to follow the transition from face-centered cubic to hexagonal closepacked stacking with atomic resolution.