Resonance measurement of periodically driven contact potential difference

TL;DR

This paper introduces a quartz resonance device that measures contact potential difference oscillations induced by modulated light, with enhanced sensitivity due to capacitance compensation, enabling applications in spectroscopy and defectoscopy of metals.

Contribution

It presents a novel quartz resonance device with capacitance compensation for precise contact potential difference measurements, improving signal-to-noise ratio and enabling new material analysis methods.

Findings

Device achieves very narrow resonance filter with small bandwidth.

Allows temperature-dependent work function measurements of metals.

Potential applications in metallic defectoscopy and imaging spectroscopy.

Abstract

A new type of quartz resonance device for measurements of oscillations of the contact potential difference induced by modulated light is described. Special attention is devoted to the compensation of the constructive capacitance of the quartz resonator by a negative capacitance. In such a way the the quartz resonance filter is very narrow and at the same time has extremely small total bandwidth, which improves significantly the signal to noise ratio. For metals, this device gives the temperature dependence of the work function and opens perspectives for creation of imaging spectroscopy based on this temperature derivative. The proposed device can be used for creation of defectoscopy of metallic materials based on the temperature derivative of the work function.