Sub-wavelength terahertz beam profiling of a THz source via an all-optical knife-edge technique

TL;DR

This paper introduces an all-optical knife-edge method for detailed sub-wavelength terahertz beam profiling, demonstrated on a nonlinear crystal used for THz generation, enabling precise characterization of THz sources.

Contribution

The paper presents a novel all-optical knife-edge technique for sub-wavelength THz beam profiling directly on the generation crystal.

Findings

Successful demonstration of the technique on a nonlinear crystal

Ability to resolve sub-wavelength features of a THz source

Potential for improved THz source characterization

Abstract

We propose an all-optical Knife Edge characterization technique and we demonstrate its working principle by characterizing the sub-{\lambda} features of a spatially modulated Terahertz source directly on the nonlinear crystal employed for the Terahertz generation.