Role of Ionized Impurity and Interface Roughness Scatterings in the Electronic Transport of InAs/GaSb Type II Superlattices at Low Temperatures

TL;DR

This paper investigates how interface roughness and ionized impurity scatterings affect electron mobility in InAs/GaSb superlattices at low temperatures, revealing that scattering rates are higher in thinner layers and mobility increases with temperature.

Contribution

It provides a detailed analysis of dominant scattering mechanisms and their impact on electron transport in InAs/GaSb superlattices at low temperatures, using numerical calculations.

Findings

Higher scattering rates in thin-layer superlattices

Mobility increases with temperature at low temperatures

Interface roughness and impurity scatterings are dominant mechanisms

Abstract

The in-plane electron mobility has been calculated in InAs/GaSb type-II superlattices at low temperatures. The interface roughness scattering and ionized impurity scattering are investigated as the dominant scattering mechanisms in limiting the electron transport at low temperatures. For this purpose, the band structures and wave functions of electrons in such superlattices are calculated by solving the K.P Hamiltonian using the numerical Finite Difference method. The scattering rates have obtained for different temperatures and structural parameters. We show that the scattering rates are high in thin-layer superlattices and the mobility rises as the temperature increases in low-temperature regime.