Novel microwave near-field sensors for material characterization, biology, and nanotechnology
R. Joffe, E.O. Kamenetskii, and R. Shavit

TL;DR
This paper introduces a novel near-field microwave sensor utilizing a ferrite-disk resonator with magnetic-dipolar-mode oscillations, enabling advanced material characterization, biological, and nanotechnological applications through enhanced electromagnetic measurement capabilities.
Contribution
The paper presents a new microwave sensor design based on a subwavelength ferrite-disk resonator with MDM oscillations, offering improved measurement of material properties including chiral structures.
Findings
Effective measurement of material parameters at microwave frequencies.
Ability to analyze chiral and complex structures.
Enhanced energy concentration in near fields.
Abstract
The wide range of interesting electromagnetic behavior of contemporary materials requires that experimentalists working in this field master many diverse measurement techniques and have a broad understanding of condensed matter physics and biophysics. Measurement of the electromagnetic response of materials at microwave frequencies is important for both fundamental and practical reasons. In this paper, we propose a novel near-field microwave sensor with application to material characterization, biology, and nanotechnology. The sensor is based on a subwavelength ferrite-disk resonator with magnetic-dipolar-mode (MDM) oscillations. Strong energy concentration and unique topological structures of the near fields originated from the MDM resonators allow effective measuring material parameters in microwaves, both for ordinary structures and objects with chiral properties.
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Taxonomy
TopicsElectromagnetic Effects on Materials · Gyrotron and Vacuum Electronics Research · Microwave and Dielectric Measurement Techniques
