An atomic resolution, single-spin magnetic resonance detection concept based on tunneling force microscopy

TL;DR

This paper proposes a novel atomic-resolution method for single-spin magnetic resonance detection using tunneling force microscopy, enabling room-temperature measurement of isolated qubits with high spatial precision.

Contribution

It introduces a new force detection technique based on spin-controlled electron tunneling for single-spin magnetic resonance at atomic scale.

Findings

Simulation results match measured AFM noise levels.

Method can detect single spins at room temperature.

Potential for atomic-scale qubit readout.

Abstract

A comprehensive study of a force detected single-spin magnetic resonance measurement concept with atomic spatial resolution is presented. The method is based upon electrostatic force detection of spin-selection rule controlled single-electron tunneling between two electrically isolated paramagnetic states. Single spin magnetic resonance detection is possible by measuring the force detected tunneling charge noise on and off spin resonance. Simulation results of this charge noise, based upon physical models of the tunneling and spin physics, are directly compared to measured AFM system noise. The results show that the approach could provide single spin measurement of electrically isolated qubit states with atomic spatial resolution at room temperature.