Radiation Tolerance of 65nm CMOS Transistors

TL;DR

This study investigates the effects of ionizing radiation on 65nm CMOS transistors at -20C, revealing less damage compared to room temperature exposures after a 1 Grad dose.

Contribution

First detailed analysis of radiation effects on 65nm CMOS transistors at cryogenic temperature, showing temperature-dependent damage differences.

Findings

Less damage at -20C than at room temperature

Damage pattern similar to room temperature exposures

Damage observed after 1 Grad dose

Abstract

We report on the effects of ionizing radiation on 65nm CMOS transistors held at approximately -20C during irradiation. The pattern of damage observed after a total dose of 1 Grad is similar to damage reported in room temperature exposures, but we observe less damage than was observed at room temperature.