CLASH: Extreme Emission Line Galaxies and Their Implication on Selection of High-Redshift Galaxies
Xingxing Huang, Wei Zheng, Junxian Wang, Holland Ford, Doron Lemze,, John Moustakas, Xinwen Shu, Arjen Van der Wel, Adi Zitrin, Brenda L. Frye,, Marc Postman, Matthias Bartelmann, Narciso Benitez, Larry Bradley, Tom, Broadhurst, Dan Coe, Megan Donahue, Leopoldo Infante

TL;DR
This study uses Hubble observations of galaxy clusters to identify extreme emission-line galaxies, revealing their potential to contaminate high-redshift galaxy samples and emphasizing their importance in future surveys.
Contribution
It presents a new method leveraging gravitational lensing to detect faint EELGs with high equivalent widths, expanding the known population at lower luminosities.
Findings
Identified 52 EELG candidates with high equivalent widths.
Faint galaxies with extreme emission lines can mimic high-redshift galaxy features.
EELGs are significant contaminants in high-redshift galaxy selection.
Abstract
We utilize the CLASH (Cluster Lensing And Supernova survey with Hubble) observations of 25 clusters to search for extreme emission-line galaxies (EELGs). The selections are carried out in two central bands: F105W (Y105) and F125W (J125), as the flux of the central bands could be enhanced by the presence of [O III] 4959, 5007 at redshift of about 0.93-1.14 and 1.57-1.79, respectively. The multi-band observations help to constrain the equivalent widths of emission lines. Thanks to cluster lensing, we are able to identify 52 candidates down to an intrinsic limiting magnitude of 28.5 and to a rest-frame [O III] 4959,5007 equivalent width of about 3737 angstrom. Our samples include a number of EELGs at lower luminosities that are missed in other surveys, and the extremely high equivalent width can be only found in such faint galaxies. These EELGs can mimic the dropout feature similar to that…
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