Quantum optical technologies for metrology, sensing and imaging
Jonathan P. Dowling, Kaushik P. Seshadreesan

TL;DR
This paper reviews recent advances in quantum optical entanglement techniques that enhance measurement precision and imaging resolution beyond classical limits, with applications in metrology, sensing, and imaging.
Contribution
It discusses new methods exploiting quantum entanglement to surpass shot-noise and diffraction limits in practical quantum metrology and imaging systems.
Findings
Quantum entanglement improves measurement sensitivity beyond shot-noise limit.
Entanglement-based techniques enhance imaging resolution beyond Rayleigh diffraction limit.
Applications include fiber gyroscopes, biological sensors, LIDAR, and optical lithography.
Abstract
Over the past 20 years, bright sources of entangled photons have led to a renaissance in quantum optical interferometry. Optical interferometry has been used to test the foundations of quantum mechanics and implement some of the novel ideas associated with quantum entanglement such as quantum teleportation, quantum cryptography, quantum lithography, quantum computing logic gates, and quantum metrology. In this paper, we focus on the new ways that have been developed to exploit quantum optical entanglement in quantum metrology to beat the shot-noise limit, which can be used, e.g., in fiber optical gyroscopes and in sensors for biological or chemical targets. We also discuss how this entanglement can be used to beat the Rayleigh diffraction limit in imaging systems such as in LIDAR and optical lithography.
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