Brightness of synchrotron radiation from wigglers
Gianluca Geloni, Vitali Kocharyan, Evgeni Saldin

TL;DR
This paper challenges the common belief that depth-of-field effects influence wiggler brightness, demonstrating through theory and simulations that these effects do not exist and proposing a new method for accurate brightness calculation.
Contribution
It clarifies the misconception about depth-of-field effects in wiggler brightness and introduces a rigorous Wigner function-based procedure for precise brightness computation.
Findings
Depth-of-field effects do not exist according to electrodynamics.
Numerical simulations show significant discrepancies with existing approximations.
Horizontal source size broadening is proportional to beamline parameters.
Abstract
According to literature, while calculating the brightness of synchrotron radiation from wigglers, one needs to account for the so called `depth-of-field' effects. In fact, the particle beam cross section varies along the wiggler. It is usually stated that the effective photon source size increases accordingly, while the brightness is reduced. Here we claim that this is a misconception originating from an analysis of the wiggler source based on geometrical arguments, regarded as almost self-evident. According to electrodynamics, depth-of-field effects do not exist: we demonstrate this statement both theoretically and numerically, using a well-known first-principle computer code. This fact shows that under the usually accepted approximations, the description of the wiggler brightness turns out to be inconsistent even qualitatively. Therefore, there is a need for a well-defined procedure…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Particle Accelerators and Free-Electron Lasers · Advanced Electron Microscopy Techniques and Applications
