Risk Estimation Without Using Stein's Lemma -- Application to Image Denoising
Sagar Venkatesh Gubbi, Chandra Sekhar Seelamantula

TL;DR
This paper introduces a method for unbiased risk estimation in image denoising that does not rely on Stein's lemma, allowing for distribution-agnostic noise handling and enabling effective parameter optimization for simple smoothers.
Contribution
It develops a new unbiased risk estimation technique for linear, shift-invariant denoisers that does not depend on noise distribution assumptions, broadening denoising applicability.
Findings
Risk estimator is distribution-agnostic for linear denoisers.
Locally adaptive Gaussian smoother achieves PSNR improvements.
GPU implementation enhances computational efficiency.
Abstract
We address the problem of image denoising in additive white noise without placing restrictive assumptions on its statistical distribution. In the recent literature, specific noise distributions have been considered and correspondingly, optimal denoising techniques have been developed. One of the successful approaches for denoising relies on the notion of unbiased risk estimation, which enables one to obtain a useful substitute for the mean-square error. For the case of additive white Gaussian noise contamination, the risk estimation procedure relies on Stein's lemma. Sophisticated wavelet-based denoising techniques, which are essentially nonlinear, have been developed with the help of the lemma. We show that, for linear, shift-invariant denoisers, it is possible to obtain unbiased risk estimates of the mean-square error without using Stein's lemma. An interesting consequence of this…
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Taxonomy
TopicsImage and Signal Denoising Methods · Advanced Image Fusion Techniques · Sparse and Compressive Sensing Techniques
