On $k$-piecewise testability (preliminary report)
Tom\'a\v{s} Masopust, Micha\"el Thomazo

TL;DR
This paper investigates the complexity of determining the minimal $k$ for which a language recognized by a DFA is $k$-piecewise testable, providing bounds and analysis for small values of $k$.
Contribution
It offers a complexity analysis and tight bounds on the depth of minimal DFAs recognizing $k$-piecewise testable languages, improving understanding of their structural properties.
Findings
Upper bound on $k$ can be exponentially larger than the minimal $k$
Provided tight bounds on DFA depth for $k$-PT languages
Analyzed complexity for small $k$ values
Abstract
For a non-negative integer , a language is -piecewise test\-able (-PT) if it is a finite boolean combination of languages of the form for and . We study the following problem: Given a DFA recognizing a piecewise testable language, decide whether the language is -PT. We provide a complexity bound and a detailed analysis for small 's. The result can be used to find the minimal for which the language is -PT. We show that the upper bound on given by the depth of the minimal DFA can be exponentially bigger than the minimal possible , and provide a tight upper bound on the depth of the minimal DFA recognizing a -PT language.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsVLSI and Analog Circuit Testing · semigroups and automata theory · Machine Learning and Algorithms
