Micro-metric electronic patterning of a topological band structure using a photon beam
Emmanouil Frantzeskakis, Nick de Jong, Berend Zwartsenberg, Yingkai, Huang, Tran V. Bay, Pieter Pronk, Erik van Heumen, Dong Wu, Yu Pan, Milan, Radovic, Nicholas C. Plumb, Nan Xu, Ming Shi, Anne de Visser, Mark S., Golden

TL;DR
This paper demonstrates that EUV light can locally modify the electronic surface states of a topological insulator, enabling precise patterning of its topological properties at the micron scale.
Contribution
The study introduces a photon-beam-based method to selectively remove trivial surface states and spatially pattern the topological surface states of a 3D topological insulator.
Findings
EUV light can exclude trivial states from the Fermi level.
The process is highly local, allowing micron-scale patterning.
Surface electronic states can be 'written' with light.
Abstract
In an ideal 3D topological insulator (TI), the bulk is insulating and the surface conducting due to the existence of metallic states that are localized on the surface; these are the topological surface states. Quaternary Bi-based compounds of BiSbTeSe with finely-tuned bulk stoichiometries are good candidates for realizing ideal 3D TI behavior due to their bulk insulating character. However, despite its insulating bulk in transport experiments, the surface region of BiSbTeSe crystals cleaved in ultrahigh vacuum also exhibits occupied states originating from the bulk conduction band. This is due to adsorbate-induced downward band-bending, a phenomenon known from other Bi-based 3D TIs. Here we show, using angle-resolved photoemission, how an EUV light beam of moderate flux can be used to exclude these topologically trivial states…
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