Phase dynamics in graphene-based Josephson junctions in the presence of thermal and correlated fluctuations

TL;DR

This paper investigates how thermal and correlated fluctuations influence phase dynamics and escape times in graphene-based Josephson junctions, revealing noise-induced phenomena like resonant activation and stability through numerical simulations.

Contribution

It provides the first detailed analysis of thermal and correlated noise effects on phase dynamics in graphene Josephson junctions, including the impact of noise correlation time.

Findings

Resonant activation observed under thermal noise.

Noise-induced stability phenomena identified.

Escape times vary with noise correlation and intensity.

Abstract

In this work we study by numerical methods the phase dynamics in ballistic graphene-based short Josephson junctions. The supercurrent through a graphene junction shows a non-sinusoidal phase-dependence, unlike a conventional junction ruled by the well-known d.c. Josephson relation. A superconductor-graphene-superconductor system exhibits superconductive quantum metastable states similar to those present in normal current-biased JJs. We explore the effects of thermal and correlated fluctuations on the escape time from these metastable states, when the system is stimulated by an oscillating bias current. As a first step, the analysis is carried out in the presence of an external Gaussian white noise source, which mimics the random fluctuations of the bias current. Varying the noise intensity, it is possible to analyze the behavior of the escape time from a superconductive metastable state in different temperature regimes. Noise induced phenomena, such as resonant activation and noise induced stability, are observed. The study is extended to the case of a coloured Gaussian noise source, analyzing how the escape time from the metastable state is affected by correlated random fluctuations for different values of the noise correlation time.