A Comparative Study of Techniques of Distant Reconstruction of Displacement Fields by using DISTRESS Simulator

TL;DR

This paper compares various digital image correlation techniques for reconstructing displacement and strain fields using a synthetic simulator, highlighting the accuracy and efficiency trade-offs among methods.

Contribution

It introduces a comprehensive evaluation of DIC methods using a novel simulator, revealing that extended DIC offers superior accuracy despite higher computational costs.

Findings

Extended DIC provides the highest strain reconstruction accuracy.

Speckle pattern quality critically affects DIC accuracy.

Increasing subset size does not significantly improve accuracy.

Abstract

Reconstruction and monitoring of displacement and strain fields is an important problem in engineering. We analyze the remote and non-obtrusive methods of strain measurement based on photogrammetry and Digital Image Correlation (DIC). The method is based on covering the photographed surface with a pattern of speckles and comparing the images taken before and after the deformation. In this study, a comprehensive literature review and comparative analysis of photogrammetric solutions is presented. The analysis is based on a specially developed Digital Image Synthesizer To Reconstruct Strain in Solids (DISTRESS) Simulator to generate synthetic images of displacement and stress fields in order to investigate the intrinsic accuracy of the existing variants of DIC. We investigated the Basic DIC and a commercial software VIC 2D, both based on displacement field reconstruction with post processing strain determination based on numerical differentiation. We also investigated what we call the Extended DIC where the strain field is determined independently of the displacement field. While the Basic DIC and VIC 2D are faster, the Extended DIC delivers the best accuracy of strain reconstruction. The speckle pattern is found to be playing a critical role in achieving high accuracy for DIC. Increase in subset size for DIC does not significantly improves the accuracy, while the smallest subset size depends on the speckle pattern and speckle size. Increase in the overall image size provides more details but does not play significant role in improving the accuracy, while significantly increasing the computation cost.