Phase Retardation and Birefringence of the Crystalline Quartz Plate in the Ultraviolet and Visible Spectrum
Xu Zhang, Fuquan Wu, Limei Qi, Xia Zhang, Dianzhong Hao

TL;DR
This paper presents a spectroscopic ellipsometry method to measure phase retardation and birefringence of crystalline quartz plates across ultraviolet and visible wavelengths, providing more accurate data especially in the ultraviolet range.
Contribution
It introduces a calibration and measurement technique for quartz birefringence in UV-visible spectrum, enhancing existing data accuracy and coverage.
Findings
Retardation measured from 190 to 770 nm
Birefringence calculated with better than 0.01 accuracy
Enriched birefringence data in ultraviolet spectrum
Abstract
A method for measuring the phase retardation and birefringence of crystalline quartz wave plate in the ultraviolet and visible spectrum is demonstrated using spectroscopic ellipsometer. After the calibration of the crystalline quartz plate, the experimental data are collected by the photodetector and sent to the computer. According to the outputted data, the retardation can be obtained in the range of 190 to 770 nm. With the retardation data, the birefringence for the quartz can be calculated in the same spectrum with an accuracy of better than . The birefringence results enrich the crystalline quartz birefringence data especially in the ultraviolet spectrum.
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Taxonomy
TopicsOptical Polarization and Ellipsometry · Optical and Acousto-Optic Technologies · Acoustic Wave Resonator Technologies
