Compatibility of the selective area growth of GaN nanowires on AlN-buffered Si substrates with the operation of light emitting diodes
Mattia Musolino, Abbes Tahraoui, Sergio Fern\'andez-Garrido, Oliver, Brandt, Achim Trampert, Lutz Geelhaar, Henning Riechert

TL;DR
This study investigates how AlN buffer layer thickness affects GaN nanowire growth on Si substrates and demonstrates the feasibility of fabricating functional GaN NW-based LEDs on Si with AlN buffers.
Contribution
It shows that 4 nm AlN layers enable well-aligned GaN nanowire growth and that such buffers are compatible with LED operation on Si substrates.
Findings
AlN layer thickness influences NW alignment and nucleation time.
4 nm AlN buffer enables high-quality NW growth.
GaN NW-LEDs on AlN-buffered Si perform similarly to those on bare Si.
Abstract
AlN layers with thicknesses between 2 and 14 nm were grown on Si(111) substrates by molecular beam epitaxy. The effect of the AlN layer thickness on the morphology and nucleation time of spontaneously formed GaN nanowires (NWs) was investigated by scanning electron microscopy and line-of-sight quadrupole mass spectrometry, respectively. We observed that the alignment of the NWs grown on these layers improves with increasing layer thickness while their nucleation time decreases. Our results show that 4 nm is the smallest thickness of the AlN layer that allows the growth of well-aligned NWs with short nucleation time. Such an AlN buffer layer was successfully employed, together with a patterned SiOx mask, for the selective-area growth (SAG) of vertical GaN NWs. In addition, we fabricated light-emitting diodes (LEDs) from NW ensembles that were grown by means of self-organization phenomena…
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