Direct observation of patterned self-assembled monolayers and bilayers on silica-on-silicon surfaces
Hadas Alon, Idan Bakish, Josh Nehrer, Assaf Y. Anderson, Chaim N., Sukenik, Avi Zadok, and Doron Naveh

TL;DR
This paper demonstrates a simple optical microscopy method to directly observe and distinguish patterned self-assembled monolayers and bilayers on silica-on-silicon surfaces, facilitating applications in sensing and device fabrication.
Contribution
The study introduces a straightforward optical contrast technique for visualizing and differentiating SAMs and bilayers without complex scanning equipment.
Findings
Optical contrast allows direct visualization of monolayers and bilayers.
Method distinguishes single-layer from bi-layer coatings.
Supports applications in sensing and device fabrication.
Abstract
Self-assembled monolayers (SAMs) of organic molecules are widely employed in surface chemistry and biology, and serve as ultra-fine lithographic resists. Due to their small thickness of only a few nanometers, the analysis of patterned monolayer surfaces using conventional methods requires thorough point-by-point scanning using complicated equipment. In the work reported herein, patterned monolayers are simply and directly observed using a bright-field optical microscope. The monolayers modify the spectral reflectivity pattern of a silica-on-silicon thin film, and introduce a contrast between bare and monolayer-coated regions of the substrate. The method can also distinguish between regions of single-layer and bi-layer coatings. The observations are supported by calculations, and by control experiments using atomic force microscopy, scanning Raman spectrometry and scanning reflection…
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Taxonomy
TopicsMolecular Junctions and Nanostructures · Photonic and Optical Devices · Force Microscopy Techniques and Applications
