Controlled pore formation on mesoporous single crystalline silicon nanowires: threshold and mechanisms
Stefan Weidemann, Maximilian Kockert, Dirk Wallacher, Manfred, Ramsteiner, Anna Mogilatenko, Klaus Rademann, Saskia F. Fischer

TL;DR
This study investigates the controlled formation of mesopores on silicon nanowires, identifying critical etching conditions, pore size characteristics, and effects on vibrational properties, advancing understanding of nanowire surface modification.
Contribution
It reveals the threshold etching conditions for pore formation on silicon nanowires and characterizes the resulting pore structures and their impact on vibrational properties.
Findings
Pores form only below 0.3 M H₂O₂ concentration.
Pore sizes are 9-13 nm in diameter.
Porous nanowires show a redshift in Raman spectra.
Abstract
Silicon nanowires are prepared by the method of the two-step metal-assisted wet chemical etching. We have analyzed the structure of solid, rough and porous nanowire surfaces of boron-doped silicon substrates with resistivities of \rho > 1000 \Omega cm, \rho = 14-23 \Omega cm, \rho < 0.01 \Omega cm by scanning electron microscopy and nitrogen gas adsorption. Silicon nanowires prepared from highly-doped silicon reveal mesopores on their surface. However, we found a limit for pore formation. Pores were only formed by etching below a critical HO concentration (c < 0.3 M). Furthermore, we have determined the pore size distribution in dependence on the etching parameters and characterized the morphology of the pores on the nanowire surface. The pores are in the regime of small mesopores with a mean diameter of 9-13 nm. Crystal and surface structure of…
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