Spectroellipsometric and ion beam analytical studies on a glazed ceramic object with metallic lustre decoration
T. Lohner, E. Ag\'ocs, P. Petrik, Z. Zolnai, E. Szil\'agyi, I., Kov\'acs, Z. Sz\H{o}kefalvi-Nagy, L. T\'oth, A.L. T\'oth, L. Ill\'es, I., B\'arsony
TL;DR
This study combines spectroscopic ellipsometry and ion beam analysis to characterize the surface layers of a glazed ceramic with metallic lustre, providing detailed insights into its composition and optical properties.
Contribution
It introduces an integrated approach using spectroscopic ellipsometry and ion beam techniques to analyze metallic lustre layers on ceramics, enhancing understanding of their structure and composition.
Findings
Determined thickness and metal content of lustre layers
Developed multilayer optical models for interpretation
Correlated spectroscopic and ion beam analytical data
Abstract
In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface lustre layers are determined by ion beam analytical techniques, i.e., Rutherford backscattering spectrometry and external beam particle-induced X-ray emission and the results were utilized in the construction of multilayer optical models for the evaluation and interpretation of the spectroellipsometric measurements.
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