On the bad metallicity and phase diagrams of Fe$_{1+\delta }X$ ($X$ =Te, Se, S, solid solutions): an electrical resistivity study

TL;DR

This study investigates the electrical resistivity behavior of Fe-based chalcogenides, revealing two resistive channels and multiple metal-nonmetal crossover events that influence their phase diagrams and are affected by various external modifications.

Contribution

It provides a systematic analysis of resistivity mechanisms and phase transitions in Fe$_{1+ ext{delta}}$X compounds, highlighting the roles of two resistive channels and their impact on phase diagrams.

Findings

Identification of two resistive channels: thermally-activated and log-in-T.

Observation of two distinct metal-to-nonmetal crossover events.

Influence of pressure, doping, and disorder on resistive processes and phase diagrams.

Abstract

Based on a systematic analysis of the thermal evolution of the resistivities of Fe-based chalcogenides Fe$_{1+\delta }$Te$_{1-x}X_{x}$ ($X$= Se, S), it is inferred that their often observed nonmetallic resistivities are related to a presence of two resistive channels: one is a high-temperature thermally-activated process while the other is a low-temperature log-in-$T$ process. On lowering temperature, there are often two metal-to-nonmetall crossover events: one from the high-$T$ thermally-activated nonmetallic regime into a metal-like phase and the other from the log-in-$T$ regime into a second metal-like phase. Based on these events, together with the magnetic and superconducting transitions, a phase diagram is constructed for each series. We discuss the origin of both processes as well as the associated crossover events. We also discuss how these resistive processes are being influenced by pressure, intercalation, disorder, doping, or sample condition and, in turn, how these modifications are shaping the associated phase diagrams.