A New Gate for Optimal Fault Tolerant & Testable Reversible Sequential Circuit Design
Vishal Pareek

TL;DR
This paper introduces a new reversible gate and design methodology for fault-tolerant, testable reversible flip-flops, significantly improving quantum cost and other parameters for reliable low-power sequential circuits.
Contribution
Proposes a novel Pareek gate for reversible flip-flops and develops fault-tolerant, testable designs with improved quantum cost and performance metrics.
Findings
Significant reduction in quantum cost compared to existing circuits
Successful development of fault-tolerant reversible flip-flops
Enhanced parameters in reversible circuit designs
Abstract
With phenomenal growth of high speed and complex computing applications, the design of low power and high speed logic circuits have created tremendous interest. Conventional computing devices are based on irreversible logic and further reduction in power consumption and/or increase in speed appears non-promising. Reversible computing has emerged as a solution looking to the power and speed requirements of future computing devices. In reversible computing logic gates used are such that input can be generated by reversing the operation from output. A number of reversible combinational circuits have been developed but the growth of sequential circuits was not significant due to feedback and fanout was not allowed. However, allowing feedback in space, a very few sequential logic blocks i.e. flip-flops have been reported in literature. In order to develop sequential circuits, flip-flops are…
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Taxonomy
TopicsRadiation Effects in Electronics · VLSI and Analog Circuit Testing · Low-power high-performance VLSI design
