Time structure measurement of the storage ring with the time-resolved X-ray excited optical luminescence method at SSRF

TL;DR

This paper presents a novel time-resolved X-ray excited optical luminescence method for measuring the storage ring's time structure with sub-nanosecond precision at SSRF, enhancing the accuracy of time-resolved synchrotron experiments.

Contribution

The paper introduces a new measurement technique combining time-resolved X-ray excited optical luminescence with time-correlated single photon counting for storage ring analysis.

Findings

Achieved measurement precision of less than 1 ns.

Successfully applied the method at SSRF's beamline.

Demonstrated the method's effectiveness for time structure analysis.

Abstract

Measuring the time structure of the storage ring on the sample spot inside the experimental hutch is a foundational step during the time-resolved experiments using the pulsed synchrotron X-rays with the time structure defined by the storage ring. In this work, the method of time-resolved X-ray excited optical luminescence was designed and implemented to do the measurement. This method is based on the principle of time-correlated single photon counting techniques. The measurement system consists of a spectrometer with a detector of photomultiplier tube, a timing system, a set of Nuclear Instrument Modules and a luminescent material of Zinc Oxide. The measurement was performed on the X-ray absorbed fine structure spectrum beamline at Shanghai Synchrotron Radiation Facility. The results show that this system can be used to measure the time structure of the storage ring with a precision of less than 1 ns.